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Shizuoka University „  Hamamatsu Instrumental Analysis Center (HIAC)

TEL. 053-478-1756

3-5-1 Johoku, Chuo-ku, Hamamatsu, Shizuoka 432-8561

INSTRUMENT (LIST and LAYOUT)

(As of March 2023)

Instruments List (Joint Research Laboratory / Innovation and Social Collaboration Building)


No. Name
(Model Number)
Use Manufacture Adviser Main
Staff
Sub
Staff
Location Billing
Unit
1 General Purpose AFM
(SPI-3800)
Surface observation of up to 20 ƒΚm square Seiko Instruments Iwata Miyake Ishikawa 102 Half Day
2 Simple AFM
(VN-8010)
Surface observation of up to 200 ƒΚm square KEYENCE Iwata Ishikawa Ishikawa 102 1 Hour
3 SPM
(JSPM-5200)
Surface observation by AFM and STM JEOL Iwata Ishikawa Ishikawa 102 Half Day
4 Digital Microscope
(KH-7700)
Observation at 35-2500x (3D observation is possible) Hirox Shimomura Miyake Shimizu 102 1 Hour
5 UV-Vis Spectrophotometer
(V-670)
Material identification using UV-Vis light JASCO Murakami Takasawa Miyake
Hayakawa
102 Half Day
6 Fluorescence Spectrophotometer
(FP-8600, FP-8700)
Qualitative and quantitative analysis by fluorescence JASCO Kawai Takasawa Ishikawa 102 Half Day
7 Laser Microscope
(VK-X3000)
Surface profile measurement KEYENCE Ishikawa Ishikawa Miyake 102 1 Hour
8 Micro XRF
(M4 TORNADO PLUS)
X-ray fluorescence spectrometry BRUKER Sakamoto Miyake Ishikawa 103 1 Hour
9 Powder XRD
(RINT2200)
Powder x-ray diffractometry Rigaku Okuya Miyake Ishikawa 103 Half Day
10 Multi Function XRD
(EMPYREAN)
X-ray diffractometry Malvern Panalytical Sakamoto Miyake Ishikawa 103 2 Hours
11 Raman Spectroscopy
(NRS-7100)
Material identification by visible light JASCO Ishikawa Takasawa Miyake
Hayakawa
103 2 Hours
12 FT-IR
(FT/IR-6300, IRT-7000)
Material identification by Infrared ray, Macro / Micro / Mapping measurement JASCO Ishikawa Takasawa Miyake
Hayakawa
103 Half Day
13 ICP
(Optima 2100DV)
Quantification of elements in solution PerkinElmer Miyabayashi Ishikawa
Miyake
Ishikawa
Miyake
104 Half Day
14 Thermal Analysis
(DTG-60A)
Measurement of heat resistance temperature and calorific value SHIMADZU Toda Kusanagi Ishikawa
Miyake
104 Half Day
15 DSC
(DSC-60Plus)
Differential scanning calorimetry SHIMADZU Neo Kusanagi Ishikawa
Miyake
104 Half Day
16 Organic Trace Element Analysis
(Flash EA)
Elemental analysis of organic trace elements Thermo Electron Toda Kusanagi Ishikawa
Miyake
104 Half Day
17 Atomic Absorption
(Solar S4-AA)
Elemental analysis by absorption Thermo Electron Kohno Kusanagi Ishikawa
Miyake
104 Half Day
18 Electrochemical Analysis System
(HZ-Pro S4)
AC impedance cyclic voltammetry HOKUTO DENKO Murakami Kusanagi Murakami 104 Half Day
19 Battery Charge / Discharge System
(HJ1001SD8)
Charging / discharging characteristics evaluation HOKUTO DENKO Murakami Kusanagi Miyake 104 Half Day
20 Zera Potential Analyzer
(Zetasizer Ultra)
Zeta potential and particle size measurements Malvern Panalytical Sakamoto Hayakawa Kusanagi 104 1 Hour
21 XRF
(EDX-8000)
Elemental analysis SHIMADZU Murakami Miyake Hayakawa 104 1 Hour
22 ESCA
(ESCA-3400)
Identification of surface atoms by photoelectron SHIMADZU Ishikawa Ishikawa Hayakawa 104
23 General Purpose SEM
(S-3000N)
Surface observation by secondary electron Hitachi High-Tech Ishikawa Hirata Miyake 104 Half Day
24 Ion Coater
(SC-701AT)
Au coater for SEM Sanyu Electron Murakami Ishikawa Hayakawa 104 1 Hour
25 Ion Milling
(EM RES101)
Processing of specimens for TEM using ion beam LEICA Murakami Ishikawa Ishikawa 104 Half Day
26 Soft Etching Surface cleaning meiwafosis Murakami Ishikawa Miyake 104 1 Hour
27 Pt Sputter
(JFC-1600)
Pt sputter for SEM JEOL Ishikawa Miyake Hayakawa 104 1 Hour
28 Cross-section Polisher
(IB-09020 CP)
Cross-sectioning of samples JEOL Ishikawa Koyama Ishikawa 104 Half Day
29 On-site FE-SEM
(JSM-7001F)
High resolution surface morphology observation, Elemental analysis, Crystal phase analysis JEOL, etc. Murakami Ishikawa Hayakawa 104 2 Hours
30 FE-EPMA
(JXA-8530F)
Trace elemental analysis JEOL Murakami Koyama Murakami 104 Half Day
31 W-SEM
(JSM-6360LA)
Surface observation JEOL Ishikawa Miyake Shimizu 10F Half Day
32 XRD
(RINT UltimaII)
X-ray diffractometry Rigaku Shimomura Koyama Murakami 10F Half Day
33 NMR
(AvanceIII HD400)
Nuclear magnetic resonance BRUKER Tanaka Y Hayakawa Hirata Innov. 1 Hour
34 Mass Spectrometer
(micrOTOF)
Mass spectrometry BRUKER Tanaka Y Hayakawa Hirata Innov. 1 Hour
35 Shape Mesuring Instrument
(VR-3200)
Shape measurement KEYENCE Ishikawa Ishikawa Hayakawa 102 1 Hour
36 3D Printer
(Bellulo200)
3D printer (Fused Deposition Modeling) Systemcreate Ishikawa Hayakawa Shimizu 101

Instruments List (Center for Nanodevice Fabrication and Analysis)


No. Name
(Model Number)
Use Manufacture Adviser Main
Staff
Sub
Staff
Location Billing
Unit
1 Thin Layer XRD
(RINT Ultima III)
Powder and thin film x-ray diffraction Rigaku Shimomura Koyama Shimomura Nano. Half Day
2 Pt / Carbon Coater
(SC701C)
Coater for SEM Sanyu Electron Ishikawa Ishikawa Miyake Nano. 1 Hour
3 Wide Area AFM
(XE-70)
Surface observation of up to 45 ƒΚm square Park Systems Ishikawa Miyake Ishikawa Nano. Half Day
4 FE-SEM
(JSM-6335F)
High resolution surface morphology observation JEOL Murakami Ishikawa Hayakawa Nano. 1 Hour
5 Analytical FE-SEM
(JSM-7001F)
High resolution surface morphology observation, Elemental analysis JEOL Murakami Ishikawa Hayakawa Nano. 2 Hours
6 FIB
(JIB-4500)
Ion beam processing JEOL Sakamoto Shimizu Sakamoto Nano. Half Day
7 Ion Slicer
(EM-09100 IS)
Processing of specimens for TEM JEOL Sakamoto Shimizu Sakamoto Nano. 1 Hour
8 XPS
(AXIS ULTRA DLD)
Identification of surface atoms by photoelectron SHIMADZU Shimomura Miyake Ishikawa Nano. Half Day
9 STEM
(JEM-2100F)
Scanning transmission electron microscopy JEOL Sakamoto Shimizu Sakamoto Nano. Half Day
10 Carbon Evaporator
(JEC-560)
Carbon deposition machine for SEM JEOL Ishikawa Miyake Ishikawa Nano. 1 Hour
11 Solar Simulator
(VK-SS-50, VK-IPCE-10)
Solar cell performance evaluation SPD Laboratory, Inc. Murakami Shimizu Ishikawa Nano. Half Day
12 Surface Area Analyzer
(TriStar‡U Plus)
Surface area and porosity analysis SHIMADZU Sakamoto Hayakawa Kusanagi Nano. Half Day

Instruments Layout







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Shizuoka University, Hamamatsu Instrumental Analysis Center

3-5-1 Johoku, Chuo-ku, Hamamatsu, Shizuoka 432-8561

TEL 053-478-1756
FAX 053-478-1020