INSTRUMENT│HIAC

INSTRUMENT (LIST and LAYOUT)

(As of March 2024)

Instruments List

No.	Name (Model Number)	Use	Manufacture	Adviser	Main Staff	Sub Staff	Billing Unit
Joint Research Laboratory 101
1	Thin Layer XRD (RINT Ultima III)	Powder and thin film x-ray diffraction	Rigaku	Sakamoto	Koyama	Miyake	Half Day
2	Laser Microscope (VK-X3000)	Surface profile measurement	KEYENCE	Ishikawa	Ishikawa	Miyake	1 Hour
3	Shape Mesuring Instrument (VR-3200)	Shape measurement	KEYENCE	Ishikawa	Ishikawa	Hayakawa	1 Hour
4	Cross-section Polisher (IB-09020 CP)	Cross-sectioning of samples	JEOL	Ishikawa	Koyama	Ishikawa	Half Day
5	Ion Milling (EM RES101)	Processing of specimens for TEM using ion beam	LEICA	Murakami	Ishikawa	Hayakawa	Half Day
6	Soft Etching	Surface cleaning	meiwafosis	Murakami	Ishikawa	Miyake	1 Hour
7	Surface Area Analyzer (TriStarⅡ Plus)	Surface area and porosity analysis	SHIMADZU	Sakamoto	Hayakawa	Kusanagi	Half Day
8	Pt Sputter (JFC-1600)	Pt sputter for SEM	JEOL	Ishikawa	Miyake	Hayakawa	1 Hour
9	HR FE-SEM (SU8600)	High resolution surface morphology observation, Elemental analysis	Hitachi High-Tech	Suda	Ishikawa	Hayakawa	-
Joint Research Laboratory 102
10	STEM (JEM-2100F)	Scanning transmission electron microscopy	JEOL	Sakamoto	Shimizu	Sakamoto	Half Day
11	Pt / Carbon Coater (SC701C)	Coater for SEM	Sanyu Electron	Ishikawa	Ishikawa	Miyake	1 Hour
12	GD-OES (GDA750)	Elemental analysis, Layer thickness determination	Rigaku, Spectruma	Kikuchi	Ishikawa	Hayakawa	-
Joint Research Laboratory 103
13	Raman Spectroscopy (NRS-7100)	Material identification by visible light	JASCO	Ishikawa	Takasawa	Miyake Hayakawa	2 Hours
14	FT-IR (FT/IR-6300, IRT-7000)	Material identification by Infrared ray, Macro / Micro / Mapping measurement	JASCO	Ishikawa	Takasawa	Miyake Hayakawa	Half Day
15	Powder XRD (RINT2200)	Powder x-ray diffractometry	Rigaku	Okuya	Miyake	Ishikawa	Half Day
16	Multi Function XRD (EMPYREAN)	X-ray diffractometry	Malvern Panalytical	Sakamoto	Miyake	Ishikawa	2 Hours
17	Micro XRF (M4 TORNADO PLUS)	X-ray fluorescence spectrometry	BRUKER	Sakamoto	Miyake	Ishikawa	1 Hour
Joint Research Laboratory 104
18	Analytical FE-SEM (JSM-7001F)	High resolution surface morphology observation, Elemental analysis	JEOL	Murakami	Ishikawa	Hayakawa	2 Hours
19	On-site FE-SEM (JSM-7001F)	High resolution surface morphology observation, Elemental analysis, Crystal phase analysis	JEOL, etc.	Murakami	Ishikawa	Hayakawa	2 Hours
20	General Purpose SEM (S-3000N)	Surface observation by secondary electron	Hitachi High-Tech	Ishikawa	Hirata	Miyake	Half Day
21	FE-EPMA (JXA-8530F)	Trace elemental analysis	JEOL	Murakami	Koyama	Murakami	Half Day
22	FIB (JIB-4500)	Ion beam processing	JEOL	Sakamoto	Shimizu	Sakamoto	Half Day
23	Digital Microscope (KH-7700)	Observation at 35-2500x (3D observation is possible)	Hirox	Ishikawa	Miyake	Shimizu	1 Hour
24	Atomic Absorption (Solar S4-AA)	Elemental analysis by absorption	Thermo Electron	Kohno	Kusanagi	Ishikawa Miyake	Half Day
25	ICP (Optima 2100DV)	Quantification of elements in solution	PerkinElmer	Miyabayashi	Ishikawa Miyake	Ishikawa Miyake	Half Day
26	Simple AFM (VN-8010)	Surface observation of up to 200 μm square	KEYENCE	Iwata	Ishikawa	Ishikawa	1 Hour
27	XPS (AXIS ULTRA DLD)	Identification of surface atoms by photoelectron	SHIMADZU	Kawaguchi	Ishikawa	Miyake	Half Day
28	Ion Coater (SC-701AT)	Au coater for SEM	Sanyu Electron	Murakami	Ishikawa	Hayakawa	1 Hour
Joint Research Laboratory 304
29	General Purpose AFM (SPI-3800)	Surface observation of up to 20 μm square	Seiko Instruments	Iwata	Miyake	Ishikawa	Half Day
30	UV-Vis Spectrophotometer (V-670)	Material identification using UV-Vis light	JASCO	Murakami	Takasawa	Miyake Hayakawa	2 hours
31	Fluorescence Spectrophotometer (FP-8600, FP-8700)	Qualitative and quantitative analysis by fluorescence	JASCO	Kawai	Takasawa	Ishikawa	Half Day
32	Thermal Analysis (DTG-60A)	Measurement of heat resistance temperature and calorific value	SHIMADZU	Toda	Kusanagi	Ishikawa Miyake	Half Day
33	DSC (DSC-60Plus)	Differential scanning calorimetry	SHIMADZU	Neo	Kusanagi	Ishikawa Miyake	Half Day
34	Organic Trace Element Analysis (Flash EA)	Elemental analysis of organic trace elements	Thermo Electron	Toda	Kusanagi	Ishikawa Miyake	Half Day
35	Electrochemical Analysis System (HZ-Pro S4)	AC impedance cyclic voltammetry	HOKUTO DENKO	Murakami	Kusanagi	Murakami	Half Day
36	Battery Charge / Discharge System (HJ1001SD8)	Charging / discharging characteristics evaluation	HOKUTO DENKO	Murakami	Kusanagi	Miyake	Half Day
37	Zera Potential Analyzer (Zetasizer Ultra)	Zeta potential and particle size measurements	Malvern Panalytical	Sakamoto	Hayakawa	Kusanagi	1 Hour
38	XRF (EDX-8000)	Elemental analysis	SHIMADZU	Murakami	Miyake	Hayakawa	1 Hour
39	ESCA (ESCA-3400)	Identification of surface atoms by photoelectron	SHIMADZU	Ishikawa	Ishikawa	Hayakawa
Joint Research Laboratory 1010
40	W-SEM (JSM-6360LA)	Surface observation	JEOL	Ishikawa	Miyake	Shimizu	Half Day
41	XRD (RINT UltimaII)	X-ray diffractometry	Rigaku	Sakamoto	Koyama	Murakami	Half Day
Research Institute of Electronics 243
42	Wide Area AFM (XE-70)	Surface observation of up to 45 μm square	Park Systems	Ishikawa	Miyake	Ishikawa	Half Day
43	Ion Slicer (EM-09100 IS)	Processing of specimens for TEM	JEOL	Sakamoto	Shimizu	Sakamoto	1 Hour
44	Solar Simulator (VK-SS-50, VK-IPCE-10)	Solar cell performance evaluation	SPD Laboratory, Inc.	Murakami	Shimizu	Ishikawa	Half Day
Organization for Innovation and Social Collaboration 208
45	NMR (AvanceIII HD400)	Nuclear magnetic resonance	BRUKER	Tanaka Y	Hayakawa	Hirata	1 Hour
46	Mass Spectrometer (micrOTOF)	Mass spectrometry	BRUKER	Sato	Hayakawa	Hirata	1 Hour
Others
47	3D Printer (Bellulo200)	3D printer (Fused Deposition Modeling)	Systemcreate	Ishikawa	Hayakawa	Shimizu
48	Carbon Evaporator (JEC-560)	Carbon deposition machine for SEM	JEOL	Ishikawa	Miyake	Ishikawa	1 Hour